Spectrometer XRF THICK800A

THICK XRF spectrometer 800A is designed to analyze the thickness and composition of galvanic coatings specially designed to permit convenient multi-point analysis of the products in the plating industry, jewelry and electronics. THICK 800A spectrometer can be used to study the content of gold, platinum, silver and other precious metals in the jewelry industry and research of coatings. Also conducts analysis in the plating industry, both the composition and thickness of electroplated coatings and plating bath composition. The analyzer provides the measurement of up to 24 elements or five layers of coatings. It comes with software that contains elements of the fundamental parameter method (FP).

XRF analyzer THICK 800A is equipped with an overhead light source and a collimator with a small cross-section of for precise localization of the measuring point. 2D mobile platform, dual laser tracker and a high-resolution camera, ensure precise positioning of the measuring point.

Additional Info

Model: THICK 800A - EDXRF spectrometer for measuring the thickness and composition of metallic coatings
Application: Alloy analysis, Coating analysis
Analysis range: 2 ppm - 99,9%
Detector: Si-PIN
Energy resolution: approx. 160 eV
Measured elements: from S to U up to 24 elements simultaneously
Measurement precision: 10 nm for the thickness of coatings, repeatability: 0.05μm (outer layer of Au below 1 micrometer)
Measurement atmosphere: Air
Tube power: 5-50 kV
Power: 230V AC
Forms of samples: solid
Weight: approx. 90 kg
Sample chamber dimensions: 517 x 352 x 150mm
Dimensions: 576 × 495 × 545mm
Additional informations: Mobile platform with a range of motion 30mm horizontal directions and 120mm in the vertical. Dual laser positioning system with a high-resolution camera. A collimator mounted depending on application requirements.